A MOS switched-capacitor instrumentation amplifier

Abstract

Describes a precision switched-capacitor sampled-data instrumentation amplifier using NMOS polysilicon gate technology. It is intended for use as a sample-and-hold amplifier for low level signals in data acquisition systems. The use of double correlated sampling technique achieves high power supply rejection, low DC offset, and low 1/f noise voltage. Matched circuit components in a differential configuration minimize errors from switch channel charge injection. Very high common mode rejection (120 dB) is obtained by a new sampling technique which prevents the common mode signal from entering the amplifier. This amplifier achieves 1 mV typical input offset voltage, greater than 95 dB PSRR, 0.15 percent gain accuracy, 0.01 percent gain linearity, and an RMS input referred noise voltage of 30 /spl mu/V/input sample.