Noise in buried channel charge-coupled devices
- 1 February 1976
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 11 (1), 147-155
- https://doi.org/10.1109/jssc.1976.1050690
Abstract
No abstract availableThis publication has 16 references indexed in Scilit:
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