High-angle annular dark field scanning transmission electron microscopy of the antiphase boundary in a rapidly solidified B2 type TiPd compound
- 1 January 2007
- journal article
- research article
- Published by Taylor & Francis Ltd in Philosophical Magazine Letters
- Vol. 87 (1), 59-64
- https://doi.org/10.1080/09500830601105667
Abstract
High-angle annular dark field scanning transmission electron microscopy (HAADF-STEM) with Z-contrast is applied to characterize the antiphase boundary (APB) of the B2 structure in a rapidly solidified TiPd melt-spun compound. The atomic shift associated with the R = (1/2) a 0 ⟨111⟩ type displacement vector is directly observed at the boundary. A microstructure modification of the melt-spun compound with the cooling rate during solidification is also described.Keywords
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