A versatile double aberration-corrected, energy filtered HREM/STEM for materials science
- 30 April 2005
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 103 (1), 7-15
- https://doi.org/10.1016/j.ultramic.2004.11.010
Abstract
No abstract availableKeywords
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