Worst case total dose radiation response of 0.35 /spl mu/m SOI CMOSFETs
- 1 December 1999
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 46 (6), 1817-1823
- https://doi.org/10.1109/23.819159
Abstract
No abstract availableKeywords
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