Bias dependence of buried oxide hardness during total dose irradiation
- 4 December 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 2 references indexed in Scilit:
- Materials and processing parameters affecting the radiation tolerance of SIMOX devicesPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- A detailed study of the changes in buried oxide charge as a function of processing and irradiationPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003