Interfacial Melting of Ice in Contact withSiO2

Abstract

The physical behavior of condensed matter can be drastically altered in the presence of interfaces. Using a high-energy x-ray transmission-reflection scheme, we have studied ice-${\mathrm{SiO}}_2$ model interfaces. We observed the formation of a quasiliquid layer below the bulk melting temperature and determined its thickness and density as a function of temperature. The quasiliquid layer has stronger correlations than water and a large density close to ${\rho }_{\mathrm{HDA}}=1.17\mathrm{g}/{\mathrm{cm}}^3$ of high-density amorphous ice suggesting a structural relationship with the postulated high-density liquid phase of water.