Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching
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- 1 March 2009
- journal article
- research article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 105 (5), 053711
- https://doi.org/10.1063/1.3079797
Abstract
We demonstrate spectrally resolved photoluminescence quenching as a means to determine the excitondiffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.Keywords
This publication has 38 references indexed in Scilit:
- The effects of optical interference on exciton diffusion length measurements using photocurrent spectroscopyJournal of Applied Physics, 2008
- Exciton diffusion length in the organic semiconductor diindenoperyleneApplied Physics Letters, 2008
- Management of singlet and triplet excitons for efficient white organic light-emitting devicesNature, 2006
- The path to ubiquitous and low-cost organic electronic appliances on plasticNature, 2004
- Erratum: “Small molecular weight organic thin-film photodetectors and solar cells” [J. Appl. Phys. 93, 3693 (2003)]Journal of Applied Physics, 2004
- Morphology and interdiffusion behavior of evaporated metal films on crystalline diindenoperylene thin filmsJournal of Applied Physics, 2003
- Ultrathin Organic Films Grown by Organic Molecular Beam Deposition and Related TechniquesChemical Reviews, 1997
- Excitons in crystalline thin films of 3,4,9,10-perylenetetracarboxylic dianhydride studied by photocurrent responseChemical Physics Letters, 1995
- Merocyanine organic solar cellsJournal of Applied Physics, 1978
- Molecular Fluorescence and Energy Transfer Near InterfacesAdvances in Chemical Physics, 1978