Polytypoid structures in annealed In2O3–ZnO films
- 2 November 1998
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 73 (18), 2585-2587
- https://doi.org/10.1063/1.122513
Abstract
Atomic-resolution Z-contrast images demonstrate unambiguously that the annealed, metalorganic chemical vapor deposition derived transparent films have a polytypoid microstructure, consisting of ZnO slabs of variable width separated by single In–O octahedral layers. These In–O layers induce a polarity inversion in the two adjacent ZnO layers, which is reversed again by a mirror domain boundary inside each ZnO slab.
Keywords
This publication has 14 references indexed in Scilit:
- Highly Transparent and Conductive Zn2In2O5 Thin Films Prepared by RF Magnetron SputteringJapanese Journal of Applied Physics, 1995
- Syntheses and Single-Crystal Data of Homologous Compounds, In2O3(ZnO)m (m = 3, 4, and 5), InGaO3(ZnO)3, and Ga2O3(ZnO)m (m = 7, 8, 9, and 16) in the In2O3-ZnGa2O4-ZnO SystemJournal of Solid State Chemistry, 1995
- Structure of indium iron oxideActa Crystallographica Section C Crystal Structure Communications, 1994
- Atomic resolution Z-contrast imaging of interfacesActa Metallurgica et Materialia, 1992
- High-resolution Z-contrast imaging of crystalsUltramicroscopy, 1991
- High-resolution incoherent imaging of crystalsPhysical Review Letters, 1990
- New intergrowth phases in the ZnOIn2O3 systemJournal of Solid State Chemistry, 1988
- Highly Conductive and Transparent Aluminum Doped Zinc Oxide Thin Films Prepared by RF Magnetron SputteringJapanese Journal of Applied Physics, 1984
- Transparent conductors—A status reviewThin Solid Films, 1983
- Neuartige Phasen mit wurtzitähnlichen Strukturen im System ZnO-In2O3Zeitschrift für anorganische und allgemeine Chemie, 1967