Impact of high-power stress on dynamic ON-resistance of high-voltage GaN HEMTs
Open Access
- 1 December 2012
- journal article
- Published by Elsevier BV in Microelectronics Reliability
- Vol. 52 (12), 2875-2879
- https://doi.org/10.1016/j.microrel.2012.08.023
Abstract
No abstract availableKeywords
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