Direct transfer patterning on three dimensionally deformed surfaces at micrometer resolutions and its application to hemispherical focal plane detector arrays
- 31 December 2008
- journal article
- research article
- Published by Elsevier BV in Organic Electronics
- Vol. 9 (6), 1122-1127
- https://doi.org/10.1016/j.orgel.2008.07.011
Abstract
No abstract availableKeywords
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