Stuck-at tuple-detection: a fault model based on stuck-at faults for improved defect coverage
- 27 November 2002
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- On the effects of test compaction on defect coveragePublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- On the decline of testing efficiency as fault coverage approaches 100%Published by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- An experimental chip to evaluate test techniques experiment resultsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002