Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork
- 13 March 2000
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 76 (11), 1470-1472
- https://doi.org/10.1063/1.126067
Abstract
Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.This publication has 19 references indexed in Scilit:
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