Resistance Transition in NiO Thin Film and Its Temperature Dependence
- 1 January 2012
- journal article
- research article
- Published by Taylor & Francis Ltd in Ferroelectrics
- Vol. 435 (1), 155-160
- https://doi.org/10.1080/00150193.2012.740332
Abstract
Reversible bi-stable on and off conduction states are examined on Cu/NiO/Pt structure prepared by thermal oxidation of deposited Ni layer. Unipolar resistive switching behavior is obtained with negative operation voltage and the on-state current decreases with temperature. This transition polarity and temperature dependence both agree with the presence of p-type NiO conduction and the diffusive Cu top electrode. The current-voltage plots in full-log interpret different off state conduction properties in low and high electric field, and also help to perceive the temperature effect on off-state current. The off-state impedance spectroscopy at 25°C−85°C provides consistent observation on the off-state transport characteristics.Keywords
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