DRAM based Intrinsic Physical Unclonable Functions for System Level Security
- 20 May 2015
- conference paper
- conference paper
- Published by Association for Computing Machinery (ACM)
Abstract
Physical Unclonable Functions (PUF) are the result of random uncontrollable variables in the manufacturing process. A PUF can be used as a source of random but reliable data for applications such as generating chip identification and encryption keys. Among various types of PUFs, an intrinsic PUF is the result of a preexisting manufacturing process, does not require any additional circuitry, and is cost effective. In this paper, we introduce an intrinsic PUF based on dynamic random access memories (DRAM). DRAM PUFs can be used in low cost identification applications and also have several advantages over other PUFs such as large input patterns. The DRAM PUF relies on the fact that the capacitor in the DRAM initializes to random values at startup. We demonstrate real DRAM PUFs and describe an experimental setup to test different operating conditions on three DRAMs to achieve the highest reliable results. Finally, we select the most stable bits to use as chip ID using our enrollment algorithm.Keywords
Funding Information
- Honeywell Corporation
- Comcast Corporation
This publication has 13 references indexed in Scilit:
- Dynamic memory-based physically unclonable function for the generation of unique identifiers and true random numbersPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2014
- Design of SRAM PUF with improved uniformity and reliability utilizing device aging effectPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2014
- Physical Unclonable Functions and Applications: A TutorialProceedings of the IEEE, 2014
- Bit selection algorithm suitable for high-volume production of SRAM-PUFPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2014
- On the Practicability of Cold Boot AttacksPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2013
- The Impact of Aging on an FPGA-Based Physical Unclonable FunctionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2011
- Device aging-based physically unclonable functionsPublished by Association for Computing Machinery (ACM) ,2011
- Power-Up SRAM State as an Identifying Fingerprint and Source of True Random NumbersInternational Conference on Acoustics, Speech, and Signal Processing (ICASSP), 2008
- Physical unclonable functions for device authentication and secret key generationProceedings of the 39th conference on Design automation - DAC '02, 2007
- A statistical test suite for random and pseudorandom number generators for cryptographic applicationsPublished by National Institute of Standards and Technology (NIST) ,2000