In‐Situ Preparation and Analysis of Functional Oxides
- 1 October 2005
- journal article
- research article
- Published by Wiley in Advanced Engineering Materials
- Vol. 7 (10), 945-949
- https://doi.org/10.1002/adem.200500125
Abstract
No abstract availableKeywords
This publication has 13 references indexed in Scilit:
- Electronic surface properties of rf-magnetron sputtered In2O3:SnSolid State Ionics, 2004
- Electronic structure, x-ray spectra, and magnetic properties of the LiCoO2−δ and NaxCoO2 nonstoichiometric oxidesPhysics of the Solid State, 2002
- XPS analysis of new lithium cobalt oxide thin-films before and after lithium deintercalationThin Solid Films, 2001
- Role of Surfaces and Interfaces for the Electronic Properties of Conducting OxidesMRS Proceedings, 2001
- Electronic properties of In2O3 surfacesApplied Physics Letters, 2000
- Energy Level Alignment and Interfacial Electronic Structures at Organic/Metal and Organic/Organic InterfacesAdvanced Materials, 1999
- Band-theory description of high-energy spectroscopy and the electronic structure ofPhysical Review B, 1992
- Electronic structure of CoO, Li-doped CoO, andPhysical Review B, 1991
- Surface composition and oxidation of the layered oxides AMO2Journal of Physics and Chemistry of Solids, 1990
- Photoemission studies of the interaction of Li and solid molecular oxygenPhysical Review B, 1989