Detector geometry, thermal diffuse scattering and strain effects in ADF STEM imaging
Open Access
- 30 April 1995
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 58 (1), 6-17
- https://doi.org/10.1016/0304-3991(94)00173-k
Abstract
No abstract availableKeywords
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