Atom probe crystallography: Atomic-scale 3-D orientation mapping
- 30 June 2012
- journal article
- Published by Elsevier BV in Scripta Materialia
- Vol. 66 (11), 907-910
- https://doi.org/10.1016/j.scriptamat.2012.02.022
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Three-Dimensional Orientation Mapping in the Transmission Electron MicroscopeScience, 2011
- Nanostructural hierarchy increases the strength of aluminium alloysNature Communications, 2010
- Electron tomography and holography in materials scienceNature Materials, 2009
- Structure and bonding at the atomic scale by scanning transmission electron microscopyNature Materials, 2009
- Direct measurement of dopant distribution in an individual vapour–liquid–solid nanowireNature Nanotechnology, 2009
- Imaging of Arsenic Cottrell Atmospheres Around Silicon Defects by Three-Dimensional Atom Probe TomographyScience, 2007
- Three-Dimensional Atom-Probe Tomography: Advances and ApplicationsAnnual Review of Materials Research, 2007
- Atom probe tomographyReview of Scientific Instruments, 2007
- Three-Dimensional Atomic-Scale Imaging of Impurity Segregation to Line DefectsScience, 1999
- Observation of atomic planes in 3DAP analysisUltramicroscopy, 1998