XPS investigation of impurities containing boron films affected by energetic deuterium implantation and thermal desorption
- 1 February 2015
- journal article
- Published by Elsevier BV in Journal of Nuclear Materials
- Vol. 457, 118-123
- https://doi.org/10.1016/j.jnucmat.2014.10.097
Abstract
No abstract availableFunding Information
- National Magnetic Confinement Fusion Science Program (2013GB1100005, 2013GB110004, 2013GB105002)
- NIFS collaboration program (NIFS07KOBA020, NIFS10KUHR008)
- Science Foundation of Institute of Plasma Physics
- Chinese Academy of Sciences
- Center of Instrumental Analysis at Shizuoka University
This publication has 31 references indexed in Scilit:
- Retention behavior of hydrogen isotopes in boron film deposited on SS-316 for LHD first wallFusion Engineering and Design, 2010
- Molecular Dynamics Simulations of Deuterium Trapping and Re-emission in Tungsten CarbideThe Journal of Physical Chemistry C, 2010
- Helium Atom Scattering Studies of the Structures and Vibrations of the H2, HD, and D2Monolayers on NaCl(001)The Journal of Physical Chemistry B, 2004
- Behavior of tritium release from thin boron films deposited on SS316Journal of Nuclear Materials, 2004
- Implanted hydrogen isotope retention and chemical behavior in boron thin films for wall conditioningJournal of Nuclear Materials, 2004
- Studies on structural and chemical characterization for boron coating films deposited by PCVDJournal of Nuclear Materials, 2004
- Plasma surface engineering in first wall of tokamakSurface and Coatings Technology, 2000
- Activation experiments at TFTR in deuterium-tritium neutron fieldFusion Engineering and Design, 1998
- A comparison of tokamak operation with metallic getters (Ti, Cr, Be) and boronizationJournal of Nuclear Materials, 1990
- Effects of boronization of the first wall in TFTRJournal of Nuclear Materials, 1990