A Fast Computational Technique for Accurate Permittivity Determination Using Transmission Line Methods
- 1 January 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Microwave Theory and Techniques
- Vol. 31 (3), 249-254
- https://doi.org/10.1109/tmtt.1983.1131471
Abstract
A fast analytical method is given for determining perrnittivity characteristics at microwave frequencies. The experimental setup uses a single-moded cylindrical waveguide filled with dielectric and followed by a load or by a moving short. In this way, transmission-reflection and short-circuited line methods are compared. by including the uncertainties in length and in the reflection and transmission parameters, the permittivity uncertainty region is determined. It is shown that for optimum accuracy of the permittivity, specific lengths in combination with a moving short are needed.Keywords
This publication has 3 references indexed in Scilit:
- A Combined Total Reflection-Transmission Method in Application to Dielectric SpectroscopyIEEE Transactions on Instrumentation and Measurement, 1978
- Measurement of Dielectric Constant and Loss Tangent in Materials Having Large Dielectric Constants (Correspondence)IEEE Transactions on Microwave Theory and Techniques, 1968
- Determination of Reflection Coefficients and Insertion Loss of a Wave-Guide JunctionJournal of Applied Physics, 1953