A Combined Total Reflection-Transmission Method in Application to Dielectric Spectroscopy
- 1 January 1978
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Instrumentation and Measurement
- Vol. 27 (3), 285-288
- https://doi.org/10.1109/tim.1978.4314682
Abstract
A combined total reflection-transmission method for permittivity measurements at radio and microwave frequencies is described. Analytical expressions for the dielectric constant and the loss factor of a sample, viewed as a two-port in the transmission system, in terms of the measured scattering parameters are given. ne uncertainty of measurements of the dielectric constant and the loss factor is discussed and a method ofselecting an optimum sample length is suggested.Keywords
This publication has 3 references indexed in Scilit:
- Time domain automatic network analyzer for measurement of RF and microwave componentsPublished by National Institute of Standards and Technology (NIST) ,1975
- Measurement of the Intrinsic Properties of Materials by Time-Domain TechniquesIEEE Transactions on Instrumentation and Measurement, 1970
- Measurement of RF properties of materials a surveyProceedings of the IEEE, 1967