High-Resolution Transmission Electron Microscopy on an Absolute Contrast Scale
- 4 June 2009
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 102 (22), 220801
- https://doi.org/10.1103/physrevlett.102.220801
Abstract
A fully quantitative approach to high-resolution transmission electron microscopy requires a satisfactory match between image simulations and experiments. While almost perfect agreement between simulations and experiments is routinely achieved on a relative contrast level, a huge mutual discrepancy in the absolute image contrast by a factor of 3 has been frequently reported. It is shown that a major reason for this well-known contrast discrepancy, which is often called Stobbs-factor problem, lies in the neglect of the detector modulation-transfer function in image simulations.Keywords
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