Pulsed-laser testing methodology for single event transients in linear devices
- 20 December 2004
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 51 (6), 3716-3722
- https://doi.org/10.1109/tns.2004.839263
Abstract
A methodology for testing linear devices for single event transients that uses a pulsed laser to supplement a heavy-ion accelerator is proposed. The method is based on an analysis of plots of transient amplitudes versus width over a range of laser pulse input energies and heavy-ion LETs. Additional data illustrating the method are presented that include the dependence of SETs on circuit configuration in a comparator (LM111) and operational amplifier (LM124). If judiciously used, the methodology has the advantage that the amount of heavy-ion accelerator testing can be reduced.Keywords
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