Single event upset (SEU) sensitivity dependence of linear integrated circuits (ICs) on bias conditions
- 1 December 1997
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Nuclear Science
- Vol. 44 (6), 2325-2332
- https://doi.org/10.1109/23.659055
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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