A sensitive near-field microscope for thermal radiation
- 1 March 2010
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 81 (3), 033706
- https://doi.org/10.1063/1.3360826
Abstract
A scattering-type scanning near-field optical microscope in long-wavelength infrared (LWIR) region is developed by using an extremely sensitive detector, called the charge-sensitive infrared phototransistor. A tungsten probe attached to a quartz tuning fork is controlled in shear-force mode. Evanescent wave at a sample surface is periodically scattered by slowly (2 Hz) modulating the probe in the direction normal to the sample surface. Near-field microscopy of thermal LWIR radiation from room-temperature Au/GaAs gratings is demonstrated without using any external illumination or excitation. Achieved spatial resolution is better than 300 nm.This publication has 21 references indexed in Scilit:
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