Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy
Top Cited Papers
- 15 August 2000
- journal article
- Published by Elsevier BV in Optics Communications
- Vol. 182 (4-6), 321-328
- https://doi.org/10.1016/s0030-4018(00)00826-9
Abstract
No abstract availableKeywords
This publication has 21 references indexed in Scilit:
- Coherent near field optical microscopyOptics Communications, 2000
- Electromagnetic fields in the cutoff regime of tapered metallic waveguidesOptics Communications, 1999
- Contrast of microwave near-field microscopyApplied Physics Letters, 1997
- Material contrast in scanning near-field optical microscopy at 1–10 nm resolutionPhysical Review B, 1997
- Infrared-reflection-mode near-field microscopy using an apertureless probe with a resolution of λ/600Optics Letters, 1996
- Scanning Interferometric Apertureless Microscopy: Optical Imaging at 10 Angstrom ResolutionScience, 1995
- Surface-enhanced optical microscopyJournal of the Optical Society of America B, 1985
- The effects of the interaction between resonances in the electromagnetic response of a sphere-plane structure; applications to surface enhanced spectroscopySurface Science, 1983
- Electromagnetic theory of enhanced Raman scattering by molecules adsorbed on rough surfacesThe Journal of Chemical Physics, 1980
- Super-resolution Aperture Scanning MicroscopeNature, 1972