Wind-induced roughening of thin liquid films
- 26 January 2004
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 84 (4), 532-534
- https://doi.org/10.1063/1.1644335
Abstract
A constant wind shear stress is shown to induce roughness on molecularly thin perfluoropolyether films that are susceptible to dewetting. These wind-induced roughening or dewetting features are pinned to the silicon substrate surface, indicating that these perfluoropolyethers have a heterogeneous interaction with the surface. These results highlight the role of chemical heterogeneity in nucleating dewetting phenomena.Keywords
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