ToF-SIMS Depth Profiling of Cells:z-Correction, 3D Imaging, and Sputter Rate of Individual NIH/3T3 Fibroblasts
- 24 April 2012
- journal article
- research article
- Published by American Chemical Society (ACS) in Analytical Chemistry
- Vol. 84 (11), 4880-4885
- https://doi.org/10.1021/ac300480g
Abstract
Proper display of three-dimensional time-of-flight secondary ion mass spectrometry (ToF-SIMS) imaging data of complex, nonflat samples requires a correction of the data in the z-direction. Inaccuracies in displaying three-dimensional ToF-SIMS data arise from projecting data from a nonflat surface onto a 2D image plane, as well as possible variations in the sputter rate of the sample being probed. The current study builds on previous studies by creating software written in Matlab, the ZCorrectorGUI (available at http://mvsa.nb.uw.edu/), to apply the z-correction to entire 3D data sets. Three-dimensional image data sets were acquired from NIH/3T3 fibroblasts by collecting ToF-SIMS images, using a dual beam approach (25 keV Bi3+ for analysis cycles and 20 keV C602+ for sputter cycles). The entire data cube was then corrected by using the new ZCorrectorGUI software, producing accurate chemical information from single cells in 3D. For the first time, a three-dimensional corrected view of a lipid-rich subcellular region, possibly the nuclear membrane, is presented. Additionally, the key assumption of a constant sputter rate throughout the data acquisition was tested by using ToF-SIMS and atomic force microscopy (AFM) analysis of the same cells. For the dried NIH/3T3 fibroblasts examined in this study, the sputter rate was found to not change appreciably in x, y, or z, and the cellular material was sputtered at a rate of approximately 10 nm per 1.25 × 1013 ions C602+/cm2.Keywords
This publication has 49 references indexed in Scilit:
- Exploring the Surface Sensitivity of TOF-Secondary Ion Mass Spectrometry by Measuring the Implantation and Sampling Depths of Bin and C60 Ions in Organic FilmsAnalytical Chemistry, 2011
- Probing orientation of immobilized humanized anti‐lysozyme variable fragment by time‐of‐flight secondary‐ion mass spectrometryJournal of Biomedical Materials Research Part A, 2011
- The surface molecular functionality of decellularized extracellular matricesBiomaterials, 2011
- ToF‐SIMS depth profiling of trehalose: the effect of analysis beam dose on the quality of depth profilesSurface and Interface Analysis, 2011
- ToF‐SIMS imaging and depth profiling of HeLa cells treated with bromodeoxyuridineSurface and Interface Analysis, 2011
- Time of Flight Mass Spectrometry Imaging of Samples Fractured In Situ with a Spring-Loaded Trap SystemAnalytical Chemistry, 2010
- The effect of incident angle on the C60+ bombardment of molecular solidsApplied Surface Science, 2008
- Freeze-Etching and Vapor Matrix Deposition for ToF-SIMS Imaging of Single CellsLangmuir, 2008
- Fluorescence, XPS, and TOF-SIMS Surface Chemical State Image Analysis of DNA MicroarraysJournal of the American Chemical Society, 2007
- Sputtering Yields for C60 and Au3 Bombardment of Water Ice as a Function of Incident Kinetic EnergyAnalytical Chemistry, 2007