VIm-Scan: A Low Overhead Scan Design Approach for Protection of Secret Key in Scan-Based Secure Chips
- 1 May 2007
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 26th IEEE VLSI Test Symposium (vts 2008)
- p. 455-460
- https://doi.org/10.1109/vts.2007.89
Abstract
Scan-based DFT enhances the testability of a system by making its internal nodes more observable and controllable. However, in case of a secure chip, scan chain increases its vulnerability to attack, where the attacker can extract secret information by scanning out states of internal nodes. This paper presents VIm-Scan: a low overhead scan design methodology that maintains all the advantages of a traditional scan-based testing yet prevents secure key extraction through the scan out process. Experimental results show that the proposed approach entails significantly lesser design overhead (~5times reduction in number of additional gates) with comparable or better protection against attack than existing techniques.Keywords
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