Time development and flux dependence of neutron-irradiation induced defects in silicon pad detectors
- 1 April 1999
- journal article
- Published by Elsevier BV in Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
- Vol. 426 (1), 51-55
- https://doi.org/10.1016/s0168-9002(98)01468-5
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Reverse annealing of the effective impurity concentration and long term operational scenario for silicon detectors in future collider experimentsNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment, 1994