The glass transition of thin film polymer/polymer blends: Interfacial interactions and confinement
- 1 April 2002
- journal article
- research article
- Published by AIP Publishing in The Journal of Chemical Physics
- Vol. 116 (13), 5801-5806
- https://doi.org/10.1063/1.1456035
Abstract
We examined the influence of film thickness and composition on the effective T g of compatible thin film mixtures of polystyrene (PS) and tetramethylbisphenol-A polycarbonate (TMPC) on SiO x / Si substrates using spectroscopic ellipsometry. Our measurements reveal that while the T g of TMPC films increased with decreasing film thickness, h, the effective T g of thin film mixtures of PS and TMPC decreased with decreasing film thickness. In these mixtures, T g was independent of film thickness at large h. We also found that while the T g of bulk mixtures of TMPC/PS exhibited large negative deviations from additivity with composition, such deviations were negligible in the thin film mixtures. The thickness dependence of T g is compared with theory.This publication has 41 references indexed in Scilit:
- Polymer Chain Relaxation: Surface Outpaces BulkMacromolecules, 2001
- Heterogeneous dynamics at the glass transition in van der Waals liquids, in the bulk and in thin filmsThe European Physical Journal E, 2001
- Molecular mobility in polymer thin filmsPhysical Review E, 2000
- Glass transition temperature and dynamics of α-process in thin polymer filmsEurophysics Letters, 1999
- Polymer Mobility in Thin FilmsMacromolecules, 1996
- Free-Volume Hole Properties of Polymer Blends Probed by Positron Annihilation Spectroscopy: MiscibilityMacromolecules, 1995
- Positronium Formation as a Probe of Polymer Surfaces and Thin FilmsPhysical Review Letters, 1995
- Tracer Diffusion in the Blends of Polystyrene and Tetramethylbisphenol A PolycarbonateMacromolecules, 1995
- Film Thickness Dependent Thermal Expansion in Ultrathin Poly(methyl methacrylate) Films on SiliconMacromolecules, 1995
- Observation of temperature dependent thicknesses in ultrathin polystyrene films on siliconPhysical Review Letters, 1993