Planning accelerated life tests with type II censored data
- 1 February 1986
- journal article
- research article
- Published by Informa UK Limited in Journal of Statistical Computation and Simulation
- Vol. 23 (4), 273-297
- https://doi.org/10.1080/00949658608810881
Abstract
This paper presents methods for planning accelerated life tests for models in which the logarithm (or some other appropriate transformation) of time-to-failure follows a location-scale distribution and the location parameter is a function of stress. We give exact expressions for the BLUE of the lOOPth percentile of the life distribution at design conditions and for the variance of this estimator. Then we describe methods for evaluating the important properties of test plans and for finding approximate continuous and exact discrete optimum test plans. A numerical example illustrates the methods.Keywords
This publication has 16 references indexed in Scilit:
- A Comparison of Accelerated Life Test Plans for Weibull and Lognormal Distributions and Type I CensoringTechnometrics, 1984
- Theory for Optimum Accelerated Censored Life Tests for Weibull and Extreme Value DistributionsTechnometrics, 1978
- Linear Estimation of a Regression Relationship from Censored Data: Part II Best Linear Unbiased Estimation and TheoryTechnometrics, 1973
- Design of Over-Stress Life-Test Experiments When Failure Times Have the Two-Parameter Weibull DistributionTechnometrics, 1972
- The Moments of Log-Weibull Order StatisticsTechnometrics, 1969
- Optimal Experimental DesignsThe Annals of Mathematical Statistics, 1966
- Optimal Spacing and Weighting in Polynomial PredictionThe Annals of Mathematical Statistics, 1964
- An efficient method for finding the minimum of a function of several variables without calculating derivativesThe Computer Journal, 1964
- Optimal Accelerated Life Designs for EstimationTechnometrics, 1962
- REVIEWSBiometrika, 1954