Impact of Scaling on MOS Analog Performance
- 1 February 1983
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 18 (1), 106-114
- https://doi.org/10.1109/jssc.1983.1051906
Abstract
No abstract availableThis publication has 23 references indexed in Scilit:
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