Characterization of Glass Insulating Thick Films with Ag Conductors for Multilayer Packages
Open Access
- 21 January 2021
- Vol. 14 (3), 494
- https://doi.org/10.3390/ma14030494
Abstract
In this paper, an insulating film was successfully prepared by sintering 35 wt % CaO-15 wt % Al2O3-10 wt % B2O3-40 wt % SiO2 glass at 875 °C. After sintering, the main component of the insulating film was glass-ceramics. The main crystal phase was CaAl2Si2O8, and the crystallization activation energy was 189.76 kJ/mol. After preparing the insulating film, its color turned yellow, and the diffusion of Ag was found by XPS and XRD data. When the temperature increased to 875 °C, the color of the insulating film became lighter, and the silver content decreased. The adhesion of the multilayer structure could reach 875 N. The dielectric constant of the insulating film in the multilayer structure was approximately 5, and the dielectric loss was 0.0011. After sintering, the dielectric strength of the insulating film could reach 13.11 kV/mm, which fully meets the requirements of a complex packaging structure.Keywords
This publication has 21 references indexed in Scilit:
- Advantages and Challenges of 10-Gbps Transmission on High-Density Interconnect BoardsJournal of Electronic Materials, 2016
- Diffusivity of silver ions in the low temperature co-fired ceramic (LTCC) substratesJournal of Materials Science, 2011
- Synthesis and characterization of CBS glass/ceramic composites for LTCC applicationJournal of Alloys and Compounds, 2009
- Characterizations of CaO–B2O3–SiO2 glass–ceramics: Thermal and electrical propertiesJournal of Alloys and Compounds, 2008
- Crystallization and microstructure of Li2O–Al2O3–SiO2 glass containing complex nucleating agentThermochimica Acta, 2006
- Surface characterization study of Ag, AgO, andusing x-ray photoelectron spectroscopy and electron energy-loss spectroscopyPhysical Review B, 2000
- Crystallization Kinetics and Properties of Nonstoichiometric Cordierite‐Based Thick‐Film DielectricsJournal of the American Ceramic Society, 1999
- Crystallization Kinetics and Mechanism of Low‐Dielectric, Low‐Temperature, Cofirable CaO‐B2O3‐SiO2 Glass‐CeramicsJournal of the American Ceramic Society, 1999
- Crystallization kinetics of basalt glassCeramics International, 1996
- Characterization Of Glass-Ceramic Dielectric Thick Films With Cu Conductors for Multilayer PackagesMRS Proceedings, 1996