Polarized Resonant Inelastic X-Ray Scattering as an Ultrafine Probe of Excited States of
- 24 February 2006
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 96 (7), 077006
- https://doi.org/10.1103/physrevlett.96.077006
Abstract
X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in at the Cu edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu states.
Keywords
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