Streaming Access to ADCs and DACs for Mixed-Signal ATPG
- 13 July 2016
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Design & Test
- Vol. 33 (6), 38-45
- https://doi.org/10.1109/mdat.2016.2590982
Abstract
This article proposes a small digital circuit that can be added to each ADC/DAC parallel port to provide fast streaming serial access and facilitate efficient ATPG. The circuit connectivity can be described in IEEE 1687's instrument connectivity language.Keywords
This publication has 3 references indexed in Scilit:
- A Mixed-Signal Test Bus and Analog BIST with 'Unlimited' Time and Voltage ResolutionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2011
- Experiences with parametric BIST for production testing PLLs with picosecond precisionPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2010
- Design for testability for mixed analog/digital ASICsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003