Automated microscopy for electron tomography
- 31 October 1992
- journal article
- Published by Elsevier BV in Ultramicroscopy
- Vol. 46 (1-4), 207-227
- https://doi.org/10.1016/0304-3991(92)90016-d
Abstract
No abstract availableKeywords
This publication has 18 references indexed in Scilit:
- Measurement of the spherical aberration coefficient of transmission electron microscopes by beam-tilt-induced image displacementsUltramicroscopy, 1991
- Performance of electron image converters with YAG single-crystal screen and CCD sensorUltramicroscopy, 1991
- Contrast in the electron spectroscopic imaging mode of a TEM. I. Influence of zero‐loss filtering on scattering contrastJournal of Microscopy, 1989
- Autotuning of a TEM using minimum electron doseUltramicroscopy, 1989
- A three-dimensional approach to mitotic chromosome structure: evidence for a complex hierarchical organization.The Journal of cell biology, 1987
- The importance of beam alignment and crystal tilt in high resolution electron microscopyUltramicroscopy, 1983
- Procedures for focusing, stigmating and alignment in high resolution electron microscopyJournal of Microscopy, 1983
- An automatic focusing and astigmatism correction system for the SEM and CTEMJournal of Microscopy, 1982
- The detection quantum efficiency of electronic image recording systemsJournal of Microscopy, 1982
- Coma-free alignment of high resolution electron microscopes with the aid of optical diffractogramsUltramicroscopy, 1978