Comparison of several background compensation methods useful for evaluation of energy-dispersive X-ray fluorescence spectra
- 31 March 1995
- journal article
- Published by Elsevier BV in Spectrochimica Acta Part B: Atomic Spectroscopy
- Vol. 50 (2), 149-169
- https://doi.org/10.1016/0584-8547(94)00118-f
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Monte Carlo simulation of conventional and synchrotron energy‐dispersive x‐ray spectrometersX-Ray Spectrometry, 1993
- A general Monte Carlo simulation of energy-dispersive X-ray fluorescence spectrometers—I: Unpolarized radiation, homogeneous samplesSpectrochimica Acta Part B: Atomic Spectroscopy, 1993
- General approach for quantitative energy dispersive x-ray fluorescence analysis based on fundamental parametersAnalytical Chemistry, 1991
- SNIP, a statistics-sensitive background treatment for the quantitative analysis of PIXE spectra in geoscience applicationsNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1988
- A discussion of PIXAN and PIXANPC: The AAEC PIXE analysis computer packagesNuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1987
- AXIL-PC, software for the analysis of complex X-ray spectraChemometrics and Intelligent Laboratory Systems, 1986
- A simple procedure for fitting a backgound to a certain class of measured spectraJournal of Applied Crystallography, 1981
- Linear and non‐linear peak fitting in energy‐dispersive X‐ray fluorescenceX-Ray Spectrometry, 1979
- A method for the accurate description of the full-energy peaks in non-linear least-squares analysis of x-ray spectraNuclear Instruments and Methods, 1977
- A computer analysis of X-ray fluorescence spectraNuclear Instruments and Methods, 1977