Micro-scale deformation measurement using the digital image correlation technique and scanning electron microscope imaging
- 1 August 2008
- journal article
- Published by SAGE Publications in The Journal of Strain Analysis for Engineering Design
- Vol. 43 (8), 719-728
- https://doi.org/10.1243/03093247jsa412
Abstract
This paper presents a study of micro-scale deformation of materials utilizing scanning electron microscopy (SEM) images and the digital image correlation (DIC) technique. A loading stage was integrated into the SEM imaging system. During the experiment, a series of SEM images of the specimen were acquired in situ. The DIC technique was then applied to these SEM images to calculate the displacement and strain field at the area of interest. Additional surface preparation may be needed in order to have an effective pattern for DIC analysis. Two applications are presented in the paper. Using small tensile specimens, the mechanical properties of electrodeposited nickel-based LIGA (an acronym from German words for lithography, electroplating, and moulding) specimens were characterized. In this case, the natural microstructural feature of the specimen surface was used directly as the pattern for DIC analysis. This method was also applied to study the strain concentration around the crack tip during the ductile fracture test of Al 6061-T651. In contrast to the previous case, the DIC patterns were generated by sputtering a thin layer of gold film on to the specimen surface through the copper mesh grid.Keywords
This publication has 19 references indexed in Scilit:
- Micro- and Nanoscale Deformation Measurement of Surface and Internal Planes via Digital Image CorrelationExperimental Mechanics, 2007
- Development of Patterns for Digital Image Correlation Measurements at Reduced Length ScalesExperimental Mechanics, 2006
- Microscopic Strain Mapping Using Scanning Electron Microscopy Topography Image Correlation at Large StrainThe Journal of Strain Analysis for Engineering Design, 2005
- Development of patterns for nanoscale strain measurements: I. Fabrication of imprinted Au webs for polymeric materialsNanotechnology, 2004
- In-plane deformation measurement using the atomic force microscope moiré methodNanotechnology, 2000
- Digital image correlation using Newton-Raphson method of partial differential correctionExperimental Mechanics, 1989
- Application of an optimized digital correlation method to planar deformation analysisImage and Vision Computing, 1986
- Applications of digital-image-correlation techniques to experimental mechanicsExperimental Mechanics, 1985
- Deformation measurement during powder compaction by a scanning-moiré methodExperimental Mechanics, 1984
- Determination of displacements using an improved digital correlation methodImage and Vision Computing, 1983