Preparation of flat-polished specimens for SEM-backscattered electron imaging and X-ray microanalysis—importance of epoxy impregnation
- 1 April 2003
- journal article
- Published by Elsevier BV in Cement and Concrete Research
- Vol. 33 (4), 611-616
- https://doi.org/10.1016/s0008-8846(02)01029-3
Abstract
No abstract availableThis publication has 7 references indexed in Scilit:
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