Application of surface chemical analysis tools for characterization of nanoparticles
Top Cited Papers
- 6 January 2010
- journal article
- review article
- Published by Springer Science and Business Media LLC in Analytical and Bioanalytical Chemistry
- Vol. 396 (3), 983-1002
- https://doi.org/10.1007/s00216-009-3360-1
Abstract
The important role that surface chemical analysis methods can and should play in the characterization of nanoparticles is described. The types of information that can be obtained from analysis of nanoparticles using Auger electron spectroscopy (AES), X-ray photoelectron spectroscopy (XPS), time-of-flight secondary-ion mass spectrometry (TOF-SIMS), low-energy ion scattering (LEIS), and scanning-probe microscopy (SPM), including scanning tunneling microscopy (STM) and atomic force microscopy (AFM), are briefly summarized. Examples describing the characterization of engineered nanoparticles are provided. Specific analysis considerations and issues associated with using surface-analysis methods for the characterization of nanoparticles are discussed and summarized, with the impact that shape instability, environmentally induced changes, deliberate and accidental coating, etc., have on nanoparticle properties. Atomic force microscopy image of Cu2O nanodots formed on a SrTiO3 substrate.Keywords
This publication has 99 references indexed in Scilit:
- Electron microscopy localization and characterization of functionalized composite organic-inorganic SERS nanoparticles on leukemia cellsUltramicroscopy, 2008
- Modeling the relaxed cohesive energy of metallic nanoclustersMaterials Letters, 2006
- Effect of “buffer layers” on the optical properties of silicon nanocrystal superlatticesOptical Materials, 2005
- Information depth and the mean escape depth in Auger electron spectroscopy and x-ray photoelectron spectroscopyJournal of Vacuum Science & Technology A, 2002
- Formation of Platinum Silicide on a Platinum Nanoparticle Array Model Catalyst Deposited on Silica during Chemical ReactionNano Letters, 2000
- Monte Carlo Calculations of the Sputtering of Grains: Enhanced Sputtering of Small GrainsThe Astrophysical Journal, 1998
- XPS intensities and binding energy shifts as metal dispersion parameters in Ni/SiO2 catalystsSurface and Interface Analysis, 1990
- Quantitation of coverages on rough surfaces by XPS: An overviewSurface and Interface Analysis, 1988
- ESCA Studies of Supported CatalystsApplied Spectroscopy Reviews, 1988
- The characterization of heterogeneous catalysts by XPS based on geometrical probability 1: Monometallic catalystsSurface and Interface Analysis, 1986