Secondary electron imaging in the variable pressure scanning electron microscope
- 1 September 1998
- Vol. 20 (6), 436-441
- https://doi.org/10.1002/sca.1998.4950200603
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Electron‐gas interactions in the environmental scanning electron microscopes gaseous detectorScanning, 1996
- Imaging deep holes in structures with gaseous secondary electron detection in the environmental scanning electron microscopeScanning, 1996
- A database on electron‐solid interactionsScanning, 1995
- Field-emission SEM imaging of compositional and doping layer semiconductor superlatticesUltramicroscopy, 1995
- High‐pressure scanning electron microscopy of insulating materials: A new approachJournal of Microscopy, 1991
- Mechanisms of detection and imaging in the ESEMJournal of Microscopy, 1990
- NeuerscheinungenInternational Journal of Public Health, 1990
- Theory of the Gaseous Detector Device in the Environmental Scanning Electron MicroscopePublished by Elsevier BV ,1990
- Currents Induced by Electron MotionProceedings of the IRE, 1939