Quartz Microbalance Studies of an Adsorbed Helium Film

Abstract
The resonant frequency of a quartz crystal oscillating in the thickness-shear mode changes by virtue of the mass loading due to any type of film laid down on its surfaces. For a helium film only the normal fraction remains rigidly coupled to the substrate motion. Adsorption isotherms of He4 measured with this technique show clear departures from conventional nonsuperfluid behavior. We attribute this effect to the onset and presence of superfluidity in the film.

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