Quantitative Image Reconstruction of GaN Quantum Dots from Oversampled Diffraction Intensities Alone
- 17 August 2005
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 95 (8), 085503
- https://doi.org/10.1103/physrevlett.95.085503
Abstract
The missing data problem, i.e., the intensities at the center of diffraction patterns cannot be experimentally measured, is currently a major limitation for wider applications of coherent diffraction microscopy. We report here that, when the missing data are confined within the centrospeckle, the missing data problem can be reliably solved. With an improved instrument, we recorded 27 oversampled diffraction patterns at various orientations from a GaN quantum dot nanoparticle and performed quantitative image reconstruction from the diffraction intensities alone. This work in principle clears the way for single-shot imaging experiments using x-ray free electron lasers.Keywords
This publication has 20 references indexed in Scilit:
- Taking X-Ray Diffraction to the Limit: Macromolecular Structures from Femtosecond X-Ray Pulses and Diffraction Microscopy of Cells with Synchrotron RadiationAnnual Review of Biophysics and Biophysical Chemistry, 2004
- Three-Dimensional Coherent X-Ray Diffraction MicroscopyMRS Bulletin, 2004
- Unique Phase Recovery for Nonperiodic ObjectsPhysical Review Letters, 2003
- X-ray image reconstruction from a diffraction pattern alonePhysical Review B, 2003
- Atomic Resolution Imaging of a Carbon Nanotube from Diffraction IntensitiesScience, 2003
- Inversion of x-ray diffuse scattering to images using prepared objectsPhysical Review B, 2003
- Three-Dimensional Imaging of Microstructure in Au NanocrystalsPhysical Review Letters, 2003
- High Resolution 3D X-Ray Diffraction MicroscopyPhysical Review Letters, 2002
- Reconstruction of the Shapes of Gold Nanocrystals Using Coherent X-Ray DiffractionPhysical Review Letters, 2001
- Extending the methodology of X-ray crystallography to allow imaging of micrometre-sized non-crystalline specimensNature, 1999