Characterisation of fine-scale microstructures by electron backscatter diffraction (EBSD)
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- 7 June 2004
- journal article
- Published by Elsevier BV in Scripta Materialia
- Vol. 51 (8), 771-776
- https://doi.org/10.1016/j.scriptamat.2004.05.016
Abstract
Recent developments in instrumentation and software now enable grain structures >0.1 μm to be quantitatively characterised by EBSD in conjunction with a field emission gun scanning electron microscope. The paper discusses the advantages and limitations of the technique.Keywords
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