A novel linear ridgelet network approach for analog fault diagnosis using wavelet-based fractal analysis and kernel PCA as preprocessors
- 1 April 2012
- journal article
- Published by Elsevier BV in Measurement
- Vol. 45 (3), 297-310
- https://doi.org/10.1016/j.measurement.2011.11.018
Abstract
No abstract availableThis publication has 30 references indexed in Scilit:
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