Dependence of indium–tin–oxide work function on surface cleaning method as studied by ultraviolet and x-ray photoemission spectroscopies
- 1 January 2000
- journal article
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 87 (1), 295-298
- https://doi.org/10.1063/1.371859
Abstract
No abstract availableKeywords
This publication has 11 references indexed in Scilit:
- Electronic and chemical structure of conjugated polymer surfaces and interfaces: applications in polymer-based light-emitting devicesSynthetic Metals, 1997
- Polymer light-emitting diodes: from materials to devicesPublished by SPIE-Intl Soc Optical Eng ,1997
- Surface modification of indium tin oxide by plasma treatment: An effective method to improve the efficiency, brightness, and reliability of organic light emitting devicesApplied Physics Letters, 1997
- Organic Electroluminescent DevicesScience, 1996
- Work function of indium tin oxide transparent conductor measured by photoelectron spectroscopyApplied Physics Letters, 1996
- Organic electroluminescent diodesApplied Physics Letters, 1987
- Solid-state and surface chemistry of Sn-doped In2O3 ceramicsJournal of Solid State Chemistry, 1987
- Two-layer organic photovoltaic cellApplied Physics Letters, 1986
- X-ray photoemission spectroscopy studies of Sn-doped indium-oxide filmsJournal of Applied Physics, 1977
- Techniques for the Measurement of Photoemission Energy Distribution Curves by the ac MethodReview of Scientific Instruments, 1970