Design for thermal testability (DfTT) and a CMOS realization

Abstract

International audienceThe paper presents the idea of design for thermal testability (DfTT) of electronic or microelectromechanical systems (MEMS). The suggested method enables both on-line and off-line thermal monitoring of systems provided with DfTT circuitry. A CMOS-compatible digital output temperature sensor, the key element of the required circuitry, is presented with experimental results. Sensor placement and result readout strategies are discussed and evaluated