SET and SEFI Characterization of the 65 nm SmartFusion2 Flash-Based FPGA under Heavy Ion Irradiation
- 1 July 2015
- conference paper
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE) in 2015 IEEE Radiation Effects Data Workshop (REDW)
Abstract
SET and SEFI characterization of the SmartFusion2 flash-based FPGA under heavy ion irradiation is presented. Functional blocks such as the PLL and Microcontroller Sub System are characterized and presented.Keywords
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