Ferroelectricity in thin perovskite films
- 9 August 1999
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 75 (6), 856-858
- https://doi.org/10.1063/1.124536
Abstract
We report on the investigation of ferroelectricity in thin tetragonal single-crystalline perovskite films of Pb(Zr0.2Ti0.8)O3 grown by off-axis rf magnetron sputtering. The local ferroelectric properties of atomically smooth films, with thicknesses ranging from a few unit cells to 800 Å, were measured using a combination of electric force microscopy and piezoelectric microscopy. The time dependence of the measured signals reveals a stable ferroelectric polarization in films down to thicknesses of 40 Å.Keywords
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